摘要
In this work, ICP-assisted hot wire implantation doping was carried out to fabricate c-Si solar cells. The obtained junction depth obtained was around 70 nm and the carrier concentration of the phosphorus was approximately 9.34 × 1020 cm-3. The efficiency of the fabricated SiNx/textured c-Si photovoltaic device was 16.08%. ICP-assisted hot wire implantation doping was also utilized to prepare Si n-MOSFETs. Experimental results indicate that the sub-threshold slope and on-off current ratio of the Si n-MOSFETs were about 0.39 V decade-1 and over 104, respectively.
| 原文 | English |
|---|---|
| 頁(從 - 到) | 96547-96550 |
| 頁數 | 4 |
| 期刊 | RSC Advances |
| 卷 | 5 |
| 發行號 | 117 |
| DOIs | |
| 出版狀態 | Published - 2015 11月 6 |
UN SDG
此研究成果有助於以下永續發展目標
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SDG 7 經濟實惠的清潔能源
All Science Journal Classification (ASJC) codes
- 一般化學
- 一般化學工程
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