Carrier concentration dependent optical properties of wurzite InN epitaxial films on Si(111) studied by spectroscopic ellipsometry

H. Ahn, C. H. Shen, C. L. Wu, S. Gwo

研究成果: Article同行評審

7 引文 斯高帕斯(Scopus)

指紋 深入研究「Carrier concentration dependent optical properties of wurzite InN epitaxial films on Si(111) studied by spectroscopic ellipsometry」主題。共同形成了獨特的指紋。

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy