Characteristics of InGaP/GaAs heterojunction bipolar transistors (HBTs) with sulfur treatments

Ssu I. Fu, Shiou Ying Cheng, Wen Chau Liu

研究成果: Article同行評審

11 引文 斯高帕斯(Scopus)

摘要

The characteristics of the InGaP/GaAs heterojunction bipolar transistors (HBTs) with sulfur treatment are studied and demonstrated. Based on the use of sulfur passivation, the series resistance of a base-emitter B-E junction can be effectively reduced and the series resistance dominant regimes (decrease of current gain) are presented at a higher collector current regime. The device with sulfur treatment can be operated under extremely low collector current ( IC ≅ 1 0 - 11 A) region, which offers the promise for low-power electronics applications. It is known that, from experimental results, the too long time for sulfur treatment is not necessary. Furthermore, the studied devices with sulfur treatment can remarkably reduce the collector-emitter offset voltage Δ VCE and emitter size effect, and improve the high-frequency performance.

原文English
頁(從 - 到)436-445
頁數10
期刊Superlattices and Microstructures
39
發行號5
DOIs
出版狀態Published - 2006 五月 1

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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