摘要
In this letter, the wet etching technique is utilized to determine the proton exchange (PE) depth of z-cut nickel-indiffused lithium niobate under different nickel indiffusion parameters. It is demonstrated that the existence of nickel atoms reduces the PE depth. While this result was applied to the fabrication of a ridge-type waveguide, the tilt angle of the sidewall on the ridge waveguide was about 70°, which has been successfully increased.
| 原文 | English |
|---|---|
| 頁(從 - 到) | 250-252 |
| 頁數 | 3 |
| 期刊 | Microwave and Optical Technology Letters |
| 卷 | 18 |
| 發行號 | 4 |
| DOIs | |
| 出版狀態 | Published - 1998 7月 |
All Science Journal Classification (ASJC) codes
- 電子、光磁材料
- 原子與分子物理與光學
- 凝聚態物理學
- 電氣與電子工程
指紋
深入研究「Characteristics of proton-exchanged wet etching on z-cut nickel-indiffused lithium niobate」主題。共同形成了獨特的指紋。引用此
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