摘要
We recently reported a new record total-area efficiency, 19.9%, for CuInGaSe2 (CIGS)-based thin-film solar cells [1]. Current-voltage analysis indicates that improved performance in the record device is due to reduced recombination. The reduced recombination was achieved by terminating the processing with a Ga-poor (In-rich) layer, which has led to a number of devices exceeding the prior (19.5%) efficiency record. This paper documents the properties of the high-efficiency CIGS by a variety of characterization techniques, with an emphasis on identifying near-surface properties associated with the modified processing.
| 原文 | English |
|---|---|
| 主出版物標題 | 33rd IEEE Photovoltaic Specialists Conference, PVSC 2008 |
| DOIs | |
| 出版狀態 | Published - 2008 |
| 事件 | 33rd IEEE Photovoltaic Specialists Conference, PVSC 2008 - San Diego, CA, United States 持續時間: 2008 5月 11 → 2008 5月 16 |
出版系列
| 名字 | Conference Record of the IEEE Photovoltaic Specialists Conference |
|---|---|
| ISSN(列印) | 0160-8371 |
Other
| Other | 33rd IEEE Photovoltaic Specialists Conference, PVSC 2008 |
|---|---|
| 國家/地區 | United States |
| 城市 | San Diego, CA |
| 期間 | 08-05-11 → 08-05-16 |
UN SDG
此研究成果有助於以下永續發展目標
-
SDG 7 經濟實惠的清潔能源
All Science Journal Classification (ASJC) codes
- 控制與系統工程
- 工業與製造工程
- 電氣與電子工程
指紋
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