Characterization of oxide tarps in 28nm p-type metal-oxide-semiconductor field-effect transistors with tip-shaped SiGe source/drain based on random telegraph noise

Bo Chin Wang, San Lein Wu, Chien Wei Huang, Yu Ying Lu, Shoou Jinn Chang, Yu Min Lin, Kun Hsien Lee, Osbert Cheng

研究成果: Article › 同行評審

14 引文 斯高帕斯（Scopus）

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Physics & Astronomy

Engineering & Materials Science