Characterization of subwavelength-scale marginal roughness from far-field irradiance

Jyh Long Chern, Shu-Chun Chu

研究成果: Conference contribution

指紋

深入研究「Characterization of subwavelength-scale marginal roughness from far-field irradiance」主題。共同形成了獨特的指紋。

Physics & Astronomy

Engineering & Materials Science