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Comparison of InGaP- with AlGaAs-gated low noise PHEMTs by current-dependent hot-electron stresses

研究成果: Conference contribution

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深入研究「Comparison of InGaP- with AlGaAs-gated low noise PHEMTs by current-dependent hot-electron stresses」主題。共同形成了獨特的指紋。
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Material Science