Comparison of optimal accelerated life tests with competing risks model under exponential distribution

Tsai Hung Fan, Yi Fu Wang

研究成果: Article同行評審

2 引文 斯高帕斯(Scopus)

摘要

Accelerated life testing (ALT) is the process of testing products by subjecting them to strict conditions in order to observe more failure data in a short time period. In this study, we compare the methods of two-level constant-stress ALT (CSALT) and simple step-stress ALT (SSALT) based on competing risks of two or more failure modes with independent exponential lifetime distributions. Optimal sample size allocation during CSALT and the optimal stress change-time in SSALT are considered based on V- and D-optimality, respectively. Under Type-I censoring, numerical results show that the optimal SSALT outperforms the optimal CSALT in a wide variety of settings. We theoretically also show that the optimal SSALT is better than the optimal CSALT under a set of conditions. A real data example is analyzed to demonstrate the performance of the optimal plans for both ALTs.

原文English
頁(從 - 到)902-919
頁數18
期刊Quality and Reliability Engineering International
37
發行號3
DOIs
出版狀態Published - 2021 4月

All Science Journal Classification (ASJC) codes

  • 安全、風險、可靠性和品質
  • 管理科學與經營研究

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