Concurrent test method for OTA-C filters

Kuen Jong Lee; Kou Shung Huang; Wei Chung Wang; S. Pookaiyaudom; R. Sitdhikorn; A. Thanachayanont

doi:10.1049/el:19970045

Concurrent test method for OTA-C filters

Kuen Jong Lee, Kou Shung Huang, Wei Chung Wang, S. Pookaiyaudom, R. Sitdhikorn, A. Thanachayanont

電機工程學系

研究成果: Article › 同行評審

5 引文斯高帕斯（Scopus）

摘要

A new testable design method for OTA-C filters is presented. By comparing the currents consumed by the circuit under test (CUT) and the currents converted from the voltage levels of the CUT, abnormalities in the function of circuit components can be concurrently detected.

原文	English
頁（從 - 到）	1-3
頁數	3
期刊	Electronics Letters
卷	33
發行號	1
DOIs	https://doi.org/10.1049/el:19970045
出版狀態	Published - 1997 1月 2

All Science Journal Classification (ASJC) codes

電氣與電子工程

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10.1049/el:19970045

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引用此

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title = "Concurrent test method for OTA-C filters",

abstract = "A new testable design method for OTA-C filters is presented. By comparing the currents consumed by the circuit under test (CUT) and the currents converted from the voltage levels of the CUT, abnormalities in the function of circuit components can be concurrently detected.",

author = "Lee, {Kuen Jong} and Huang, {Kou Shung} and Wang, {Wei Chung} and S. Pookaiyaudom and R. Sitdhikorn and A. Thanachayanont",

year = "1997",

month = jan,

day = "2",

doi = "10.1049/el:19970045",

language = "English",

volume = "33",

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journal = "Electronics Letters",

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T1 - Concurrent test method for OTA-C filters

AU - Lee, Kuen Jong

AU - Huang, Kou Shung

AU - Wang, Wei Chung

AU - Pookaiyaudom, S.

AU - Sitdhikorn, R.

AU - Thanachayanont, A.

PY - 1997/1/2

Y1 - 1997/1/2

N2 - A new testable design method for OTA-C filters is presented. By comparing the currents consumed by the circuit under test (CUT) and the currents converted from the voltage levels of the CUT, abnormalities in the function of circuit components can be concurrently detected.

AB - A new testable design method for OTA-C filters is presented. By comparing the currents consumed by the circuit under test (CUT) and the currents converted from the voltage levels of the CUT, abnormalities in the function of circuit components can be concurrently detected.

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U2 - 10.1049/el:19970045

DO - 10.1049/el:19970045

M3 - Article

AN - SCOPUS:0031546368

SN - 0013-5194

VL - 33

SP - 1

EP - 3

JO - Electronics Letters

JF - Electronics Letters

IS - 1

ER -

Concurrent test method for OTA-C filters

摘要

All Science Journal Classification (ASJC) codes

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