Control and observation structures for analog circuits

Yeong Ruey Shieh, Cheng Wen Wu

研究成果: Review article同行評審

13 引文 斯高帕斯(Scopus)

摘要

No previously proposed analog built-in self-test method allows simultaneous control of all test points, the basic diagnosis capability required for analog circuits. Here is an approach that allows observation and control of DC voltage levels of all test points simultaneously, with a calibration process that ensures accuracy.

原文English
頁(從 - 到)56-64
頁數9
期刊IEEE Design and Test of Computers
15
發行號2
DOIs
出版狀態Published - 1998 四月 1

All Science Journal Classification (ASJC) codes

  • 硬體和架構

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