Cross-plane thermoelectric properties in Si/Ge superlattices

Bao Yang, Jian L. Liu, Kang L. Wang, Gang Chen

研究成果: Conference article同行評審

7 引文 斯高帕斯(Scopus)

摘要

In this paper, a set of methods is developed to measure the Seebeck coefficient, electrical conductivity, and thermal conductivity in the cross-plane direction of thin films. The method employs microfabricated heaters, voltage and temperature sensors, and phase-lock amplifiers to determine the temperature and Seebeck voltage oscillation in the cross-plane direction of the samples, from which the thermal conductivity and Seebeck coefficient of thin films are determined simultaneously. The cross-plane electrical conductivity is also measured by a modified transmission line model. These methods are applied to Si/Ge superlattices grown by molecular beam epitaxy.

原文English
頁(從 - 到)71-76
頁數6
期刊Materials Research Society Symposium - Proceedings
691
出版狀態Published - 2002
事件Thermoelectric Materials 2001-Research and Applications - Boston, MA, United States
持續時間: 2001 十一月 262001 十一月 29

All Science Journal Classification (ASJC) codes

  • 材料科學(全部)
  • 凝聚態物理學
  • 材料力學
  • 機械工業

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