Crystallization effect of Al-Ag alloying layer in PL enhancement of ZnO thin film

Zhan Shuo Hu, Fei Yi Hung, Shoou Jinn Chang, Kuan Jen Chen, Yue Zhang Chen

研究成果: Article同行評審

7 引文 斯高帕斯(Scopus)

摘要

ZnO/Ag/Al multilayer structures were deposited on glass with different annealing conditions and were compared with as-deposited ZnO thin film. The results show that the alloying effects of the Al-Ag film not only induced different interface mechanisms through annealing, but also improved the optoelectronic properties. The alloying ratio of the Al-Ag film increased with the increasing temperatures. Due to the higher ratio of Al-Ag alloying layer, some atoms diffused into the ZnO matrix at higher annealing temperatures, and the PL of the ZnO thin film was destroyed. Oppositely, at lower annealing temperatures, the Al-Ag alloying layer had a better ratio (Al:Ag = 4:1) which could enhance the PL spectra of the ZnO thin film.

原文English
頁(從 - 到)1428-1431
頁數4
期刊Intermetallics
18
發行號8
DOIs
出版狀態Published - 2010 八月

All Science Journal Classification (ASJC) codes

  • 化學 (全部)
  • 材料力學
  • 機械工業
  • 金屬和合金
  • 材料化學

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