Cycle time reduction for semiconductor wafer fabrication facilities

Doron Meyersdorf, Taho Yang

研究成果: Paper

22 引文 (Scopus)

摘要

The issue of cycle time reduction and its impact on a company's competitive edge has been gaining considerable attention recently. Generally speaking, shorter cycle times result in better customer satisfaction, lower work-in-process (WIP), higher yield, and better capacity given tool inventory and facility constraints. This paper provides a brief review of key concepts related to cycle time and describes a methodology for cycle time reduction projects in semiconductor wafer fabrication facilities, including the critically important implementation road map step. Finally, a case study is presented to illustrate the effectiveness and potential gains of the proposed cycle time reduction methodology.

原文English
頁面418-423
頁數6
出版狀態Published - 1997 十二月 1
事件Proceedings of the 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop - Cambridge, MA, USA
持續時間: 1997 九月 101997 九月 12

Other

OtherProceedings of the 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop
城市Cambridge, MA, USA
期間97-09-1097-09-12

指紋

Semiconductor materials
Fabrication
Customer satisfaction
Industry

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Engineering(all)
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

引用此文

Meyersdorf, D., & Yang, T. (1997). Cycle time reduction for semiconductor wafer fabrication facilities. 418-423. 論文發表於 Proceedings of the 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop, Cambridge, MA, USA, .
Meyersdorf, Doron ; Yang, Taho. / Cycle time reduction for semiconductor wafer fabrication facilities. 論文發表於 Proceedings of the 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop, Cambridge, MA, USA, .6 p.
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Meyersdorf, D & Yang, T 1997, 'Cycle time reduction for semiconductor wafer fabrication facilities', 論文發表於 Proceedings of the 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop, Cambridge, MA, USA, 97-09-10 - 97-09-12 頁 418-423.

Cycle time reduction for semiconductor wafer fabrication facilities. / Meyersdorf, Doron; Yang, Taho.

1997. 418-423 論文發表於 Proceedings of the 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop, Cambridge, MA, USA, .

研究成果: Paper

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Meyersdorf D, Yang T. Cycle time reduction for semiconductor wafer fabrication facilities. 1997. 論文發表於 Proceedings of the 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop, Cambridge, MA, USA, .