摘要
A new method of Arrhenius transformation and matching is developed in this study based on the rate-temperature duality of the admittance spectroscopy measurement to extract the activation energy Ea and the attempt-to-escape frequency ν0 of a defect in GaAsN from differential capacitance spectroscopy without the Arrhenius plot and without identifying the fdC/df spectra peaks. The method consists of a set of variations that transform the iso-rate scan and/or the isothermal scan to a virtual space - activation energy, attempt-to-escape frequency, temperature, or rate. The transformed scans must be matched prior to extracting Ea and ν0 local to a fixed point in the two-dimensional temperature-rate experimental space.
原文 | English |
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文章編號 | 043903 |
期刊 | Review of Scientific Instruments |
卷 | 92 |
發行號 | 4 |
DOIs |
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出版狀態 | Published - 2021 4月 1 |
All Science Journal Classification (ASJC) codes
- 儀器