DEFECTS IN GaAs AND Al//xGa//1// minus //xAs GROWN BY MBE.

C. Y. Chang, K. Y. Cheng, Y. H. Wang, W. C. Liu, S. A. Liao

研究成果: Conference article同行評審

指紋

深入研究「DEFECTS IN GaAs AND Al//xGa//1// minus //xAs GROWN BY MBE.」主題。共同形成了獨特的指紋。

Engineering & Materials Science