Dependence of current match on back-gate bias in weakly inverted MOS transistors and its modeling

Ming Jer Chen, Jih Shin Ho, Tzuen Hsi Huang

研究成果: Article同行評審

32 引文 斯高帕斯(Scopus)

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深入研究「Dependence of current match on back-gate bias in weakly inverted MOS transistors and its modeling」主題。共同形成了獨特的指紋。

Engineering & Materials Science