Derivation of the generalized Young-Laplace equation of curved interfaces in nanoscaled solids

Tungyang Chen, Min Sen Chiu, Chung Ning Weng

研究成果: Article同行評審

273 引文 斯高帕斯(Scopus)

摘要

In nanoscaled solids, the mathematical behavior of a curved interface between two different phases with interface stress effects can be described by the generalized Young-Laplace equations [T. Young, Philos. Trans. R. Soc. London 95, 65 (1805); P. S. Laplace, Traite de Mechanique Celeste (Gauthier-Villars, Paris, 1805), Vol. 4, Supplements au Livre X]. Here we present a geometric illustration to prove the equations. By considering a small element of the curved thin interface, we model the interface stresses as in-plane stresses acting along its edges, while on the top and bottom faces of the interface the tractions are contributed from its three-dimensional bulk neighborhood. With this schematic illustration, simple force balance considerations will give the Young-Laplace equations across the interface. Similar procedures can be applied to conduction phenomena. This will allow us to reconstruct one type of imperfect interfaces, referred to as highly conducting interfaces.

原文English
文章編號074308
期刊Journal of Applied Physics
100
發行號7
DOIs
出版狀態Published - 2006

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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