TY - GEN
T1 - Design and verification of an integrated current mode switching regulator
AU - Huang, Chun Sheng
AU - Tsai, Chien Hung
AU - Wang, Jia Hui
PY - 2011
Y1 - 2011
N2 - In this paper, a design of current-mode control switching regulator was presented with loop gain analysis. The analysis was verified by the chip implementation and measurement. A current mirror based current sensor was used to sensing the inductor current information. This chip has been fabricated with a TSMC 2P4M 0.35m polyside CMOS process. The measurement result verify the buck converter with on-chip current sensing can operate with load current from 200mA-500mA in a supply voltage from 2.74.2V and the output voltage of 1.8V with no sub-harmonic condition occur. By the loop gain measurement, the correctness of the loop gain analysis is verified. The stability of proposed buck converter was guaranteed by the loop gain measurement, too.
AB - In this paper, a design of current-mode control switching regulator was presented with loop gain analysis. The analysis was verified by the chip implementation and measurement. A current mirror based current sensor was used to sensing the inductor current information. This chip has been fabricated with a TSMC 2P4M 0.35m polyside CMOS process. The measurement result verify the buck converter with on-chip current sensing can operate with load current from 200mA-500mA in a supply voltage from 2.74.2V and the output voltage of 1.8V with no sub-harmonic condition occur. By the loop gain measurement, the correctness of the loop gain analysis is verified. The stability of proposed buck converter was guaranteed by the loop gain measurement, too.
UR - http://www.scopus.com/inward/record.url?scp=79959507100&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=79959507100&partnerID=8YFLogxK
U2 - 10.1109/VDAT.2011.5783548
DO - 10.1109/VDAT.2011.5783548
M3 - Conference contribution
AN - SCOPUS:79959507100
SN - 9781424484997
T3 - Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
SP - 362
EP - 365
BT - Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
T2 - 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
Y2 - 25 April 2011 through 28 April 2011
ER -