TY - JOUR
T1 - Design in hot-carrier reliability for high performance logic applications
AU - Fang, Peng
AU - Tao, Jiang
AU - Chen, Jone F.
AU - Hu, Chenming
PY - 1998
Y1 - 1998
N2 - Static (DC) and dynamic (AC) hot carrier degradation mechanisms were reviewed. Circuit performance degradation has been correlated to individual NMOS or PMOS device under DC stress. AC degradation model calibration and evaluation guidelines were also reviewed to ensure the use of hot-carrier reliability simulation tools in circuit level. As an example, thousand-hour inverter ring oscillator speed degradation data with different fanout, stress voltages, channel length, and processes are compared with that obtained from reliability simulation. The results show that reliability simulation is a powerful tool for logic circuit design optimization. It can predict the long-term circuit hot-carrier degradation accurately. The reliability of inverter, NAND, and NOR structures are also simulated and compared.
AB - Static (DC) and dynamic (AC) hot carrier degradation mechanisms were reviewed. Circuit performance degradation has been correlated to individual NMOS or PMOS device under DC stress. AC degradation model calibration and evaluation guidelines were also reviewed to ensure the use of hot-carrier reliability simulation tools in circuit level. As an example, thousand-hour inverter ring oscillator speed degradation data with different fanout, stress voltages, channel length, and processes are compared with that obtained from reliability simulation. The results show that reliability simulation is a powerful tool for logic circuit design optimization. It can predict the long-term circuit hot-carrier degradation accurately. The reliability of inverter, NAND, and NOR structures are also simulated and compared.
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M3 - Conference article
AN - SCOPUS:0031619459
SN - 0886-5930
SP - 525
EP - 531
JO - Proceedings of the Custom Integrated Circuits Conference
JF - Proceedings of the Custom Integrated Circuits Conference
T2 - Proceedings of the 1998 IEEE Custom Integrated Circuits Conference
Y2 - 11 May 1998 through 14 May 1998
ER -