Design of reliable a-Si:H gate driver circuit with high immunity against the VTH shift of TFT and output fluctuations

Min Chin Chuang, Chun Da Tu, Kuan Wen Chou, Chih Lung Lin

研究成果: Conference contribution

摘要

AC-driving structure is utilized in this new gate driver circuit to suppress VTH shift of a-Si:H TFT. By modulating the biased-stress on pull-down TFT, the floating row lines of panels is effectively eliminated. The results depict this circuit can ensure the longer operating lifetime.

原文English
主出版物標題2010 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010
頁面305-306
頁數2
DOIs
出版狀態Published - 2010 十二月 1
事件23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010 - Denver, CO, United States
持續時間: 2010 十一月 72010 十一月 11

出版系列

名字2010 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010

Other

Other23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010
國家/地區United States
城市Denver, CO
期間10-11-0710-11-11

All Science Journal Classification (ASJC) codes

  • 原子與分子物理與光學

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