TY - GEN
T1 - Design of reliable a-Si:H gate driver circuit with high immunity against the VTH shift of TFT and output fluctuations
AU - Chuang, Min Chin
AU - Tu, Chun Da
AU - Chou, Kuan Wen
AU - Lin, Chih Lung
PY - 2010/12/1
Y1 - 2010/12/1
N2 - AC-driving structure is utilized in this new gate driver circuit to suppress VTH shift of a-Si:H TFT. By modulating the biased-stress on pull-down TFT, the floating row lines of panels is effectively eliminated. The results depict this circuit can ensure the longer operating lifetime.
AB - AC-driving structure is utilized in this new gate driver circuit to suppress VTH shift of a-Si:H TFT. By modulating the biased-stress on pull-down TFT, the floating row lines of panels is effectively eliminated. The results depict this circuit can ensure the longer operating lifetime.
UR - http://www.scopus.com/inward/record.url?scp=79951899615&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=79951899615&partnerID=8YFLogxK
U2 - 10.1109/PHOTONICS.2010.5698881
DO - 10.1109/PHOTONICS.2010.5698881
M3 - Conference contribution
AN - SCOPUS:79951899615
SN - 9781424453689
T3 - 2010 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010
SP - 305
EP - 306
BT - 2010 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010
T2 - 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010
Y2 - 7 November 2010 through 11 November 2010
ER -