Design of reliable a-Si:H gate driver circuit with high immunity against the VTH shift of TFT and output fluctuations

Min Chin Chuang, Chun Da Tu, Kuan Wen Chou, Chih Lung Lin

研究成果: Conference contribution

指紋

深入研究「Design of reliable a-Si:H gate driver circuit with high immunity against the VTH shift of TFT and output fluctuations」主題。共同形成了獨特的指紋。

Physics & Astronomy