Design of W-band high-isolation T/R switch

Chien Chang Chou, Shih Chiao Huang, Wen Chian Lai, H. C. Kuo, Huey-Ru Chuang

研究成果: Conference contribution

4 引文 斯高帕斯(Scopus)

摘要

This paper presents a W-band CMOS SPDT high isolation T/R switch fabricated in 90nm CMOS. The switch is designed by using series-shunt structure with body-floating technique to improve the insertion loss and linearity. To achieve high-isolation performance, the parallel inductor and leakage cancellation technique are adopted. The measurement results show that the designed switch has a good performance in the return loss, insertion loss and isolation in W-band 75-110GHz frequency band. Compared with reported works, the designed switch has the best isolation performance of 48 dB at 94-GHz.

原文English
主出版物標題European Microwave Week 2015
主出版物子標題"Freedom Through Microwaves", EuMW 2015 - Conference Proceedings; 2015 45th European Microwave Conference Proceedings, EuMC
發行者Institute of Electrical and Electronics Engineers Inc.
頁面1084-1087
頁數4
ISBN(電子)9782874870392
DOIs
出版狀態Published - 2015 十二月 2
事件45th European Microwave Conference, EuMC 2015 - Paris, France
持續時間: 2015 九月 72015 九月 10

出版系列

名字European Microwave Week 2015: "Freedom Through Microwaves", EuMW 2015 - Conference Proceedings; 2015 45th European Microwave Conference Proceedings, EuMC

Other

Other45th European Microwave Conference, EuMC 2015
國家France
城市Paris
期間15-09-0715-09-10

    指紋

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Radiation

引用此

Chou, C. C., Huang, S. C., Lai, W. C., Kuo, H. C., & Chuang, H-R. (2015). Design of W-band high-isolation T/R switch. 於 European Microwave Week 2015: "Freedom Through Microwaves", EuMW 2015 - Conference Proceedings; 2015 45th European Microwave Conference Proceedings, EuMC (頁 1084-1087). [7345956] (European Microwave Week 2015: "Freedom Through Microwaves", EuMW 2015 - Conference Proceedings; 2015 45th European Microwave Conference Proceedings, EuMC). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EuMC.2015.7345956