@inproceedings{f27f1c6b2acd434399798e829f09485b,
title = "Designing self-testable cellular arrays",
abstract = "We present design-for-testability techniques and built-in self-test structures for cellular arrays based on the M-testability condition, which results in the minimal number of tests. Our technique applies to arrays with arbitrary dimensions and various connections. A systolic array multiplier is given as an example, showing an overhead of only 4% for making it M-testable. Our method compares favorably with that based on pI-testability. It reduces drastically the testing costs for circuits realized as cellular arrays.",
author = "Wu, {Cheng Wen} and Lu, {Shyue Kung}",
year = "1991",
month = dec,
day = "1",
language = "English",
isbn = "0818622709",
series = "IEEE International Conference on Computer Design - VLSI in Computers and Processors",
publisher = "Publ by IEEE",
pages = "110--113",
booktitle = "IEEE International Conference on Computer Design - VLSI in Computers and Processors",
note = "Proceedings of the 1991 IEEE International Conference on Computer Design - VLSI in Computers and Processors - ICCD '91 ; Conference date: 14-10-1991 Through 16-10-1991",
}