The dynamic signature of the subwavelength variation of a rectangular aperture has recently been shown to be determinable from far-field irradiance with a precision better than 1 nm [Opt. Lett. 29, 1045 (2004)]. We have proposed, and have theoretically shown, that detection sensitivity can be greatly enhanced with an embeddedaperture Mach-Zehnder interferometer configuration, after parameter optimization. The sensitivity, in terras of derivative intensity of observed subwavelength variations, could be enhanced approximately 2.7 times, compared with the directly detected method. Another method of detection of subwavelength variation from pattern measurement of far-field diffraction has also been proposed. The associated shifting of the dark line of the diffraction pattern had a good linear correlation to subwavelength variation, which was magnified approximately 150 times, and gave good contrast for measurement.
|頁（從 - 到）||335-341|
|期刊||Journal of the Optical Society of America A: Optics and Image Science, and Vision|
|出版狀態||Published - 2005 二月|
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Computer Vision and Pattern Recognition