TY - JOUR
T1 - Determining manufacturing parameters to suppress system variance using linear and non-linear models
AU - Li, Der Chiang
AU - Chen, Wen Chih
AU - Liu, Chiao Wen
AU - Chang, Che Jung
AU - Chen, Chien Chih
PY - 2012/3
Y1 - 2012/3
N2 - Determining manufacturing parameters for a new product is fundamentally a difficult problem, because there has little suggestion information. There are several researches on this topic, and most of them focus on single specific model or the engineer's experience. As to other approaches, the usage of multiple models may be an alternative approach to help determining the parameters. This research proposed an aggregation of multiple regression and back-propagation neural network to find the manufacturing parameter's limits (upper and lower limits). A real-problem of a new product parameter setting model in the real Thin Film Transistor-Liquid Crystal Display (TFT-LCD) manufacturing company is demonstrated, where three forecasting models are applied, and t test is used to judge which models are the suitable ones. Finally, we average the computed parameter values from the chosen models to suppress the system variance. The empirical results show that the proposed method is successful in suppressing the system variance and improving the production yields.
AB - Determining manufacturing parameters for a new product is fundamentally a difficult problem, because there has little suggestion information. There are several researches on this topic, and most of them focus on single specific model or the engineer's experience. As to other approaches, the usage of multiple models may be an alternative approach to help determining the parameters. This research proposed an aggregation of multiple regression and back-propagation neural network to find the manufacturing parameter's limits (upper and lower limits). A real-problem of a new product parameter setting model in the real Thin Film Transistor-Liquid Crystal Display (TFT-LCD) manufacturing company is demonstrated, where three forecasting models are applied, and t test is used to judge which models are the suitable ones. Finally, we average the computed parameter values from the chosen models to suppress the system variance. The empirical results show that the proposed method is successful in suppressing the system variance and improving the production yields.
UR - http://www.scopus.com/inward/record.url?scp=82255162580&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=82255162580&partnerID=8YFLogxK
U2 - 10.1016/j.eswa.2011.09.067
DO - 10.1016/j.eswa.2011.09.067
M3 - Article
AN - SCOPUS:82255162580
SN - 0957-4174
VL - 39
SP - 4020
EP - 4025
JO - Expert Systems With Applications
JF - Expert Systems With Applications
IS - 4
ER -