Development of an automatic sleep-wake staging method for rats

Ting Ying Wei, Chung Ping Young

研究成果: Conference contribution

摘要

The study proposed an automated sleep-wake scoring system by using the features of electroencephalogram (EEG) and electromyogram (EMG). The method of normalization has been used to reduce the difference of features between the subjects. The proposed system would automatically discriminate the sleep-wake states into both three-state (waking, NREM and REM) and five-state (waking, NREM stage 1, NREM stage 2, transition sleep, and REM). The automated scoring results were compared with the manual scoring results that scored by the experts. The results of global agreement between the automated scoring and experts consensus in three-state scoring are 92.5% (κ=0.88) and 95.3% (κ=0.91) in five-state scoring. The results indicated that the performance of the automated sleep-wake staging system has highly reliability and accuracy.

原文English
主出版物標題2016 IEEE International Symposium on Medical Measurements and Applications, MeMeA 2016 - Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781467391726
DOIs
出版狀態Published - 2016 八月 4
事件11th IEEE International Symposium on Medical Measurements and Applications, MeMeA 2016 - Benevento, Italy
持續時間: 2016 五月 152016 五月 18

出版系列

名字2016 IEEE International Symposium on Medical Measurements and Applications, MeMeA 2016 - Proceedings

Other

Other11th IEEE International Symposium on Medical Measurements and Applications, MeMeA 2016
國家Italy
城市Benevento
期間16-05-1516-05-18

All Science Journal Classification (ASJC) codes

  • Signal Processing
  • Biomedical Engineering
  • Instrumentation

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  • 引用此

    Wei, T. Y., & Young, C. P. (2016). Development of an automatic sleep-wake staging method for rats. 於 2016 IEEE International Symposium on Medical Measurements and Applications, MeMeA 2016 - Proceedings [7533742] (2016 IEEE International Symposium on Medical Measurements and Applications, MeMeA 2016 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MeMeA.2016.7533742