Development of an Interface C framework for semiconductor e-Diagnostics systems

Min Hsiung Hung, Tsung Li Wang, Feng Yi Hsu, Fan Tien Cheng

研究成果: Article同行評審

14 引文 斯高帕斯(Scopus)

摘要

Interface C has been defined as the access interface of an e-Diagnostics system by International SEMATECH. This paper proposes a novel Interface C framework, called ICF, which aims to be a solution to the implementation of Interface C. The ICF is developed using several technologies, such as Web Services, Clustering, XML-related security techniques, and object-oriented methods. In addition to providing a variety of e-Diagnostics functions, the ICF possesses dedicated mechanisms which can solve many important issues in Interface C, such as interoperability among distributed systems, supporting remote diagnoses through multi-party collaboration, data isolation for different suppliers, diagnostics service and storage failover for assuring system availability, and the security measures related to the above issues. A prototype e-Diagnostics system based on the ICF has been constructed. Integration tests show that it works smoothly with good performance and meets the designed objectives. It is believed that the proposed ICF can be an effective solution for implementing the Interface C of e-Diagnostics systems in semiconductor industry.

原文English
頁(從 - 到)370-383
頁數14
期刊Robotics and Computer-Integrated Manufacturing
24
發行號3
DOIs
出版狀態Published - 2008 6月

All Science Journal Classification (ASJC) codes

  • 控制與系統工程
  • 軟體
  • 數學(全部)
  • 電腦科學應用
  • 工業與製造工程

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