Dynamic ISD scheme for the AVM system - A preliminary study

Yao Sheng Hsieh, Fan Tien Cheng, Chun Fang Chen, Jhao Rong Lyu, Ting Yu Lin

研究成果: Conference article同行評審

1 引文 斯高帕斯(Scopus)

摘要

Reducing the sampling rate to as low as possible is a high priority for many factories to reduce production cost. Automatic-Virtual-Metrology (AVM) based Original Intelligent Sampling Decision (Original ISD) scheme had been previously developed for reducing the sampling rate and sustaining the VM accuracy. However, the desired sampling rate of the Original ISD scheme is fixed and set manually. Hence, whenever the VM accuracy gets worse, it cannot dynamically increase the desired sampling rate in the Original ISD scheme. As a consequence, it would take more time to collect enough samples for improving the VM accuracy. Moreover, when the VM accuracy performs well all the time, it cannot automatically decrease the desired sampling rate in Original ISD, which may result in unnecessary waste. Accordingly, this paper proposes a preliminary study of a Dynamic ISD scheme to dynamically and automatically modify the sampling rate online and in real time. The Dynamic ISD scheme can monitor the VM accuracy on line as well as update the VM models in real time for maintaining the VM accuracy when the VM accuracy becomes poor. Also, the Dynamic ISD scheme can automatically reduce the sampling rate while the VM accuracy performs well.

原文English
文章編號7139469
頁(從 - 到)2060-2065
頁數6
期刊Proceedings - IEEE International Conference on Robotics and Automation
2015-June
發行號June
DOIs
出版狀態Published - 2015 6月 29
事件2015 IEEE International Conference on Robotics and Automation, ICRA 2015 - Seattle, United States
持續時間: 2015 5月 262015 5月 30

All Science Journal Classification (ASJC) codes

  • 軟體
  • 控制與系統工程
  • 人工智慧
  • 電氣與電子工程

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