Economic analysis of the HOY wireless test methodology

Yutsao Hsing, Liming Denq, Chao Hsun Chen, Cheng Wen Wu

研究成果: Article同行評審

5 引文 斯高帕斯(Scopus)

摘要

The HOY (Hypothesis, Odyssey, and Yield) test system provides wireless test access and embedded DFT, while offering lower cost and better performance than conventional ATE. This article briefly describes HOY, then proposes a test cost model to compare it with conventional ATE, and analyzes the test cost of these two methods for different manufacturing processes, area overheads, die sizes, manufacturing volumes, and test times.

原文English
文章編號5255193
頁(從 - 到)20-30
頁數11
期刊IEEE Design and Test of Computers
27
發行號3
DOIs
出版狀態Published - 2010 五月 1

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

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