Effect of Accelerating Voltage and Probe Current on EBSD Spatial Resolutions

Delphic Chen, Jui-Chao Kuo

研究成果: Conference contribution

原文English
主出版物標題5th Congress of the International Union of Microbeam Analysis Societies (IUMAS-V)
出版地Seoul Olympic Parktel, Seoul, Korea
出版狀態Published - 2011 五月 22

引用此

Chen, D., & Kuo, J-C. (2011). Effect of Accelerating Voltage and Probe Current on EBSD Spatial Resolutions. 於 5th Congress of the International Union of Microbeam Analysis Societies (IUMAS-V) Seoul Olympic Parktel, Seoul, Korea.