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Effect of in addition on Sn-Ag-Sb lead-free solder system

研究成果: Conference contribution

3   連結會在新分頁中打開 引文 斯高帕斯(Scopus)

摘要

The present study investigates the effect of 1-5wt.% Indium additions on microstructure, properties and interfacial IMC's formation of Sn-3Ag-2Sb(SAS) lead-free solder alloys. Experimental results show that addition of indium results in formation of intermetallic compounds of Ag-Sn-In phase and InSb phase. Sn atoms in Ag Sn compound formed originally in Sn-Ag solder system are replaced by In atoms in SAS-xln solder system as indium content is increased. A structural and morphological transformation ofAg 3n), Ag 2 (Sn,ln) and finally to Ag 2 (In,Sn) is confirmed. Meanwhile, transformation of interfacial Cu 6Sn 5 IMC layer to CU 6 (Sn,ln)s is progressed as the level of In content is increased and accelerated by thermal storage as well.

原文English
主出版物標題2008 10th International Conference on Electronic Materials and Packaging, EMAP 2008
頁面191-194
頁數4
DOIs
出版狀態Published - 2008
事件2008 10th International Conference on Electronic Materials and Packaging, EMAP 2008 - Taipei, Taiwan
持續時間: 2008 10月 222008 10月 24

出版系列

名字2008 10th International Conference on Electronic Materials and Packaging, EMAP 2008

Other

Other2008 10th International Conference on Electronic Materials and Packaging, EMAP 2008
國家/地區Taiwan
城市Taipei
期間08-10-2208-10-24

All Science Journal Classification (ASJC) codes

  • 硬體和架構
  • 電氣與電子工程
  • 機械工業

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