TY - JOUR
T1 - Effects of buffer layer treatments on the characteristics and performances of OLEDs
AU - Wang, Chen Tao
AU - Ting, Chu Chi
AU - Kao, Po Ching
AU - Li, Shan Rong
AU - Chu, Sheng Yuan
N1 - Funding Information:
This work was supported by the Industrial Technology Research Institute of Taiwan (107-EC-17-A-24-1303).
Publisher Copyright:
© 2018 The Electrochemical Society.
PY - 2018
Y1 - 2018
N2 - The authors demonstrated the performance of Organic Light Emitting Diodes (OLEDs) with hexylphosphonic acid (PA) or UV-ozone treatment on their molybdenum trioxide (MoO3) anode buffer layers. The OLEDs with a PA treated (5 mM @1 h) MoO 3 layer have lower turn-on voltage and low current efficiency roll-off under high operating current. The hole-only device (ITO/MoO 3 with PA or UV-ozone treatment/NPB/Al) was fabricated to calculate the active energy via temperature dependent I-V measurement. When the devices were operated at high temperatures, the activation energy of the UV-ozone treated, and untreated hole-only devices became nonlinear. However, the activation energy of the PA treated devices had a more stable performance at high temperatures. The interfacial resistance of the untreated hole-only devices and the PA and UV-ozone treated devices were calculated by Admittance Spectroscopy (AS) to be 204.5, 363, and 450 . These results indicated that the PA treated devices reduced the activation energy, surface energy mismatch, and interface resistance to enhance the efficiency of carrier injection, which in turn lowers the turn on voltage. Moreover, PA treatment produces a long carbon chain and smooths the morphology of MoO 3 to prevent roll-off phenomenon of OLEDs under high operating current.
AB - The authors demonstrated the performance of Organic Light Emitting Diodes (OLEDs) with hexylphosphonic acid (PA) or UV-ozone treatment on their molybdenum trioxide (MoO3) anode buffer layers. The OLEDs with a PA treated (5 mM @1 h) MoO 3 layer have lower turn-on voltage and low current efficiency roll-off under high operating current. The hole-only device (ITO/MoO 3 with PA or UV-ozone treatment/NPB/Al) was fabricated to calculate the active energy via temperature dependent I-V measurement. When the devices were operated at high temperatures, the activation energy of the UV-ozone treated, and untreated hole-only devices became nonlinear. However, the activation energy of the PA treated devices had a more stable performance at high temperatures. The interfacial resistance of the untreated hole-only devices and the PA and UV-ozone treated devices were calculated by Admittance Spectroscopy (AS) to be 204.5, 363, and 450 . These results indicated that the PA treated devices reduced the activation energy, surface energy mismatch, and interface resistance to enhance the efficiency of carrier injection, which in turn lowers the turn on voltage. Moreover, PA treatment produces a long carbon chain and smooths the morphology of MoO 3 to prevent roll-off phenomenon of OLEDs under high operating current.
UR - http://www.scopus.com/inward/record.url?scp=85059954092&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85059954092&partnerID=8YFLogxK
U2 - 10.1149/2.0081809jss
DO - 10.1149/2.0081809jss
M3 - Article
AN - SCOPUS:85059954092
SN - 2162-8769
VL - 7
SP - R125-R130
JO - ECS Journal of Solid State Science and Technology
JF - ECS Journal of Solid State Science and Technology
IS - 9
ER -