Effects of mechanical uniaxial stress on SiGe HBT characteristics

Tzu Juei Wang, Hung Wei Chen, Chih Hsin Ko, John Yeh, Ping Chun Yeh, Shoou Jinn Chang, San Lein Wu, Wen Chin Lee, Denny D. Tang

研究成果: Conference contribution

原文English
主出版物標題Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest
出版狀態Published - 2006
事件Third International SiGe Technology and Device Meeting, ISTDM 2006 - Princeton, NJ, United States
持續時間: 2006 五月 152006 五月 17

出版系列

名字Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest
2006

Other

OtherThird International SiGe Technology and Device Meeting, ISTDM 2006
國家/地區United States
城市Princeton, NJ
期間06-05-1506-05-17

All Science Journal Classification (ASJC) codes

  • 電腦科學(全部)
  • 電氣與電子工程
  • 電子、光磁材料
  • 原子與分子物理與光學

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