摘要
The effects of nitrogen (N) incorporation on the electron properties of GaInNAs epilayers grown by metal-organic vapor phase epitaxy (MOVPE) have been probed by the analysis of Hall-effect and persistent photoconductivity (PPC) measurement. From the analysis of temperature-dependent PPC decay kinetics of samples with different N content, we speculate that the effect of PPC in n-type GaInNAs can be ascribed to DX-type deep centers and N-induced defects undergoing large lattice relaxation upon photo-excitation. With further experimental supports to our interpretation, we have also observed that N-induced localization can be quenched through thermal annealing with different temperatures.
| 原文 | English |
|---|---|
| 頁(從 - 到) | 87-90 |
| 頁數 | 4 |
| 期刊 | Journal of Crystal Growth |
| 卷 | 290 |
| 發行號 | 1 |
| DOIs | |
| 出版狀態 | Published - 2006 4月 15 |
All Science Journal Classification (ASJC) codes
- 凝聚態物理學
- 無機化學
- 材料化學
指紋
深入研究「Effects of nitrogen incorporation on the electronic properties of Ga xIn1-xNyAs1-y epilayers probed by persistent photoconductivity」主題。共同形成了獨特的指紋。引用此
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver