摘要
In this paper, we demonstrate the AlGaN/GaN high electron mobility transistors (HEMTs) on Si substrate using an AlGaN back-barrier (BB) and super-lattice (SL) buffer to achieve high breakdown and low current collapse (CC) properties for Radio-frequency (RF) applications. The HEMTs also demonstrated low initial vertical leakage current, high thermal stability, and smaller drain-lag with reduced leakage currents as compared to the devices using step-graded (SG) AlGaN buffer. Also, the device showed improved RF performances with higher f T and f max as compared to the devices with SG buffer.
| 原文 | English |
|---|---|
| 文章編號 | 035002 |
| 期刊 | ECS Journal of Solid State Science and Technology |
| 卷 | 12 |
| 發行號 | 3 |
| DOIs | |
| 出版狀態 | Published - 2023 3月 |
All Science Journal Classification (ASJC) codes
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指紋
深入研究「Effects on RF Performance for AlGaN/GaN HEMT on Si Substrate with AlGaN Buffer Engineering」主題。共同形成了獨特的指紋。引用此
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