Efficient and Economical Test Equipment Setup Using Procorrelation

Bin Hong Lin, Cheng Wen Wu, Hwei Tsu Ann Luh

研究成果: Article同行評審

摘要

A correlation evaluation system called the Procorrelation System (PCS) is discussed. PCS system is used for obtaining high-quality correlation between die failures on premanufactured recorded correlation wafer (RCW) and the wafer test equipment setup. PCS is a simple, fast, efficient, and economical software system used for the automatic verification of the ATE setup before the starting of the mass production process. It also facilitates the failure diagnosis and recovery in equipment setup. PCS greatly reduces analysis time and test costs, when compared with the conventional full-wafer probing techniques.

原文English
頁(從 - 到)34-43
頁數10
期刊IEEE Design and Test of Computers
21
發行號1
DOIs
出版狀態Published - 2004 一月 1

All Science Journal Classification (ASJC) codes

  • 軟體
  • 硬體和架構
  • 電氣與電子工程

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