Efficient Cell-Aware Fault Modeling by Switch-Level Test Generation

Harry H. Chen, Simon Y.H. Chen, Po Yao Chuang, Cheng Wen Wu

研究成果: Conference contribution

5 引文 斯高帕斯(Scopus)

摘要

This paper proposes methods to drastically reduce the expensive analog fault simulation currently used to create cell-aware fault models. By exploiting low-power properties of common CMOS designs, most defects in the transistor-level netlist containing parasitics can be represented by just two canonical fault classes. Via simple circuit analysis, we show that faulty behaviors are completely predictable as the defect resistance parameter value varies from zero to infinity, thus eliminating the need for circuit simulation at multiple parameter values. The two canonical fault classes can be modeled by transistor switch stuck-open and stuck-closed faults. Rather than enumerating the full combination cell input patterns to search for defect detection conditions by analog fault simulation, switch-level test generation can obtain those input conditions directly, thereby reducing significantly the role of analog simulation to that of ranking conditions in terms of detection effectiveness.

原文English
主出版物標題Proceedings - 2016 IEEE 25th Asian Test Symposium, ATS 2016
發行者IEEE Computer Society
頁面197-202
頁數6
ISBN(電子)9781509038084
DOIs
出版狀態Published - 2016 十二月 22
事件25th IEEE Asian Test Symposium, ATS 2016 - Hiroshima, Japan
持續時間: 2016 十一月 212016 十一月 24

出版系列

名字Proceedings of the Asian Test Symposium
ISSN(列印)1081-7735

Other

Other25th IEEE Asian Test Symposium, ATS 2016
國家Japan
城市Hiroshima
期間16-11-2116-11-24

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

指紋 深入研究「Efficient Cell-Aware Fault Modeling by Switch-Level Test Generation」主題。共同形成了獨特的指紋。

  • 引用此

    Chen, H. H., Chen, S. Y. H., Chuang, P. Y., & Wu, C. W. (2016). Efficient Cell-Aware Fault Modeling by Switch-Level Test Generation. 於 Proceedings - 2016 IEEE 25th Asian Test Symposium, ATS 2016 (頁 197-202). [7796112] (Proceedings of the Asian Test Symposium). IEEE Computer Society. https://doi.org/10.1109/ATS.2016.33