TY - JOUR

T1 - Efficient multifrequency analysis of fault diagnosis in analog circuits based on large change sensitivity computation

AU - Lin, Bin Hong

AU - Shieh, Shao Hui

AU - Wu, Cheng Wen

N1 - Copyright:
Copyright 2014 Elsevier B.V., All rights reserved.

PY - 1996/12/1

Y1 - 1996/12/1

N2 - A fast multiple input signature register (MISR) computation algorithm for signature simulation is proposed. Based on the linear compaction algorithm the modularity property of a single input signature register (SISR), and the sparsity of the error-domain input, some new accelerating schemes - partial input look-up tables and reverse zero-checking policy - are developed to boost the signature computation speed. Mathematical analysis and simulation results show that this algorithm has an order of magnitude speedup without extra memory requirement compared with the linear compaction algorithm. Though originally derived for SISR, this algorithm is applicable to MISR by a simple conversion procedure or a bit-adjusting scheme with little effort. Consequently, a very fast MISR signature simulation can be achieved.

AB - A fast multiple input signature register (MISR) computation algorithm for signature simulation is proposed. Based on the linear compaction algorithm the modularity property of a single input signature register (SISR), and the sparsity of the error-domain input, some new accelerating schemes - partial input look-up tables and reverse zero-checking policy - are developed to boost the signature computation speed. Mathematical analysis and simulation results show that this algorithm has an order of magnitude speedup without extra memory requirement compared with the linear compaction algorithm. Though originally derived for SISR, this algorithm is applicable to MISR by a simple conversion procedure or a bit-adjusting scheme with little effort. Consequently, a very fast MISR signature simulation can be achieved.

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M3 - Conference article

AN - SCOPUS:0030420223

SP - 232

EP - 237

JO - Proceedings of the Asian Test Symposium

JF - Proceedings of the Asian Test Symposium

SN - 1081-7735

T2 - Proceedings of the 1996 5th Asian Test Symposium, ATS'96

Y2 - 20 November 1996 through 22 November 1996

ER -