Efficient pattern generation for transition-fault diagnosis using combinational circuit model

Yi Da Wang, Kuen-Jong Lee

研究成果: Conference contribution

1 引文 斯高帕斯(Scopus)

摘要

An efficient diagnosis procedure to distinguish non-equivalent transition faults and identify equivalent transition faults is proposed. This procedure consists of three main methods. The Fault Inactivation Method (FIM) generates diagnosis patterns to distinguish fault pairs by inactivating one fault and detecting the other for each fault pair, the Fault Pair Filter Method (FPF) quickly identifies a large portion of equivalent-fault pairs after FIM, and the Fault Propagation Method (FPM) generates diagnosis patterns for the remaining distinguishable fault pairs and identifies equivalent-fault pairs by initializing both faults in each pair simultaneously and creating distinguishable faulty responses. Experimental results show that only 6 out of more than 7.48∗108 fault pairs in ISCAS89 benchmark circuits cannot be handled by this method, i.e., a diagnosis resolution of higher than 99.999999%is achieved.

原文English
主出版物標題Proceedings - 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014
編輯Jia Zhou, Ting-Ao Tang
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781479932962
DOIs
出版狀態Published - 2014 一月 23
事件2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014 - Guilin, China
持續時間: 2014 十月 282014 十月 31

出版系列

名字Proceedings - 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014

Other

Other2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014
國家/地區China
城市Guilin
期間14-10-2814-10-31

All Science Journal Classification (ASJC) codes

  • 硬體和架構
  • 電氣與電子工程
  • 電腦科學應用

指紋

深入研究「Efficient pattern generation for transition-fault diagnosis using combinational circuit model」主題。共同形成了獨特的指紋。

引用此