Efficient Prognostication of Pattern Count with Different Input Compression Ratios

Fong Jyun Tsai, Chong Siao Ye, Yu Huang, Kuen Jong Lee, Wu Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski

研究成果: Conference contribution

摘要

A novel method to efficiently and accurately prognosticate the pattern count at different input compression ratios with the Embedded Deterministic Test (EDT) compression technology is proposed. With this method the total ATPG run time can be significantly reduced compared to the currently used trial-and-error method.

原文English
主出版物標題Proceedings - 2020 IEEE European Test Symposium, ETS 2020
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781728143125
DOIs
出版狀態Published - 2020 五月
事件2020 IEEE European Test Symposium, ETS 2020 - Tallinn, Estonia
持續時間: 2020 五月 252020 五月 29

出版系列

名字Proceedings of the European Test Workshop
2020-May
ISSN(列印)1530-1877
ISSN(電子)1558-1780

Conference

Conference2020 IEEE European Test Symposium, ETS 2020
國家/地區Estonia
城市Tallinn
期間20-05-2520-05-29

All Science Journal Classification (ASJC) codes

  • 電氣與電子工程
  • 工業與製造工程
  • 軟體

引用此