Efficient sampling for surface measurements

T. C. Woo, R. Liang, C. C. Hsieh, N. K. Lee

研究成果: Article同行評審

68 引文 斯高帕斯(Scopus)

摘要

The sample size is directly proportional to the time taken during inspection, while the error due to discretization relates to the quality of the process. This paper investigates two deterministic sequences of numbers, as sample coordinates, by presenting their computations and their applications to metrology. Results show a dramatic improvement in both the number of and the error in measurements.

原文English
頁(從 - 到)345-354
頁數10
期刊Journal of Manufacturing Systems
14
發行號5
DOIs
出版狀態Published - 1995

All Science Journal Classification (ASJC) codes

  • 軟體
  • 控制與系統工程
  • 硬體和架構
  • 工業與製造工程

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