Bi2(Zn1/3Nb2/3)2 O7, BiZN, materials possess high dielectric constant and low loss factor in microwave frequency region. They have good potential for device application, especially in the form of thin films. However, the microwave dielectric properties of a thin film are very difficult to be accurately measured. Evaluation on the dielectric behavior of the films through the performance of the microstrip line devices made of these films involves metallic conduction and stray field losses. A novel measuring technique, which can directly evaluate the microwave dielectric properties of a thin film is thus urgently needed. In this paper, BiZN thin films were grown on  MgO single crystal substrates using pulsed laser deposition process. The high-frequency dielectric properties of thus obtained thin films were determined using optical transmission spectroscopy (OTS). The  preferentially oriented films with pyrochlore structure can be obtained for the thin films deposited at 400-600°C substrate temperature under 0.1 mbar oxygen pressure. OTS measurements reveal that the index of refraction (n=1.95-2.35) and absorption coefficient (κ=0.28 × 10-4-2.25 × 10-4 nm-1) of the films vary insignificantly with the crystallinity of the BiZN films.
|頁（從 - 到）||33-43|
|出版狀態||Published - 2001 1月 1|
|事件||12th International Symposium on Integrated Ferroelectrics - Aachen, Germany|
持續時間: 2000 3月 12 → 2000 3月 15
All Science Journal Classification (ASJC) codes