Electronic transitions in a SimGen strained monolayer superlattice measured by photoreflectance

P. A. Dafesh, V. Arbet, K. L. Wang

研究成果: Article同行評審

8 引文 斯高帕斯(Scopus)

指紋

深入研究「Electronic transitions in a Si<sub>m</sub>Ge<sub>n</sub> strained monolayer superlattice measured by photoreflectance」主題。共同形成了獨特的指紋。

Physics & Astronomy