Electrostatic force microscopy measurements of charge trapping behavior of Au nanoparticles embedded in metal-insulator-semiconductor structure

Jung Yup Yang, Joo Hyung Kim, Jun Seok Lee, Seung Ki Min, Hyun Jung Kim, Kang L. Wang, Jin Pyo Hong

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10 引文 斯高帕斯(Scopus)

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Engineering & Materials Science

Physics & Astronomy

Chemical Compounds