Enhanced critical current density of YBa2Cu3O x films grown on Nd1/3Eu1/3Gd 1/3Ba2Cu3Ox with nano-undulated surface morphology

R. L. Meng, T. H. Johansen, I. A. Rusakova, A. Baikalov, D. Pham, F. Chen, Z. Y. Zuo, C. W. Chu

研究成果: Article同行評審

1 引文 斯高帕斯(Scopus)

摘要

We report a simple and easily controllable method where a nano-undulated surface morphology of superconducting Nd1/3Eu1/3Gd 1/3Ba2Cu3Ox (NEG) films leads to a substantial increase in the critical current density in superconducting YBa 2Cu3Ox (YBCO) films deposited by pulsed laser deposition on such NEG layers. The enhancement is observed over a wide range of fields and temperatures. Transmission electron microscopy shows that such YBCO films possess a high density of localized areas, typically 20 × 20 nm 2 in size, where distortion of atomic planes give rotational (2-5°) moiré patterns. Their distribution is random and uniform, and expected to be the origin of the enhanced flux pinning. Magneto-optical imaging shows that these films have excellent macroscopic magnetic uniformity.

原文English
頁(從 - 到)39-44
頁數6
期刊Physica C: Superconductivity and its applications
434
發行號1
DOIs
出版狀態Published - 2006 二月 1

All Science Journal Classification (ASJC) codes

  • 電子、光磁材料
  • 凝聚態物理學
  • 能源工程與電力技術
  • 電氣與電子工程

指紋

深入研究「Enhanced critical current density of YBa<sub>2</sub>Cu<sub>3</sub>O <sub>x</sub> films grown on Nd<sub>1/3</sub>Eu<sub>1/3</sub>Gd <sub>1/3</sub>Ba<sub>2</sub>Cu<sub>3</sub>O<sub>x</sub> with nano-undulated surface morphology」主題。共同形成了獨特的指紋。

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