摘要
Perovskite ferroelectric Ba0.5Sr0.5TiO3 grown epitaxially on (001) LaAlO3 substrates by pulsed laser ablation were investigated by X-ray diffraction, rocking curve and pole figure measurements. The films were found to exhibit an (100) orientation normal to the substrate surface with an in-plane relationship of [100]BSTO∥[100]LAO. As evidenced from relatively small full width at half maximum values, a small ion beam minimum yield of 2.6, a small loss tangent, and relatively large dielectric constant, the films were of excellent quality. The room temperature dielectric constant can be changed by as much as 33% by changing the bias from 0-35 V at 1 MHz, opening the possibility for developing room-temperature tunable microwave elements using such films.
原文 | English |
---|---|
頁(從 - 到) | 412-414 |
頁數 | 3 |
期刊 | Applied Physics Letters |
卷 | 75 |
發行號 | 3 |
DOIs | |
出版狀態 | Published - 1999 7月 19 |
All Science Journal Classification (ASJC) codes
- 物理與天文學(雜項)