摘要
Due to its unique electronic properties, graphene has already been identified as a promising material for future carbon based electronics. To develop graphene technology, the fabrication of a high quality P-N junction is a great challenge. Here, we describe a general technique to grow single crystalline polyaniline (PANI) films on graphene sheets using in situ polymerization via the oxidation-reduction of aniline monomer and graphene oxide, respectively, to fabricate a high quality P-N junction, which shows diode-like behavior with a remarkably low turn-on voltage (60 mV) and high rectification ratio (1880:1) up to a voltage of 0.2 V. The origin of these superior electronic properties is the preferential growth of a highly crystalline PANI film as well as lattice matching between the d-values [∼2.48 Å] of graphene and {120} planes of PANI. The epitaxial growth of highly crystalline polyaniline (PANI) layer on reduced graphene oxide (r-GO) to synthesize PANI/r-GO composites as a result of oxidation-reduction of aniline monomer and GO respectively is reported. These 2D composites behave like P-N junctions with a remarkable rectification ratio of about 1880:1 up to a voltage of 0.2V.
| 原文 | English |
|---|---|
| 頁(從 - 到) | 1277-1283 |
| 頁數 | 7 |
| 期刊 | Macromolecular Rapid Communications |
| 卷 | 32 |
| 發行號 | 16 |
| DOIs | |
| 出版狀態 | Published - 2011 8月 17 |
All Science Journal Classification (ASJC) codes
- 有機化學
- 聚合物和塑料
- 材料化學
指紋
深入研究「Epitaxial growth of crystalline polyaniline on reduced graphene oxide」主題。共同形成了獨特的指紋。引用此
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