Epitaxial integration of a nanoscale BiFeO3 phase boundary with silicon

Wen I. Liang, Chun Yen Peng, Rong Huang, Wei Cheng Kuo, Yen Chin Huang, Carolina Adamo, Yi Chun Chen, Li Chang, Jenh Yih Juang, Darrel G. Schlom, Ying Hao Chu

研究成果: Article同行評審

6 引文 斯高帕斯(Scopus)

摘要

The successful integration of the strain-driven nanoscale phase boundary of BiFeO3 onto a silicon substrate is demonstrated with extraordinary ferroelectricity and ferromagnetism. The detailed strain history is delineated through a reciprocal space mapping technique. We have found that a distorted monoclinic phase forms prior to a tetragonal-like phase, a phenomenon which may correlates with the thermal strain induced during the growth process.

原文English
頁(從 - 到)1322-1326
頁數5
期刊Nanoscale
8
發行號3
DOIs
出版狀態Published - 2016 1月 21

All Science Journal Classification (ASJC) codes

  • 材料科學(全部)

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