Erroneous evaluation of electron and ion temperatures from a contaminated retarding potential trap

Oyama Koichiro; Hirao Kunio

doi:10.1016/0032-0633(75)90154-3

Erroneous evaluation of electron and ion temperatures from a contaminated retarding potential trap

Oyama Koichiro, Hirao Kunio

太空與電漿科學研究所

研究成果: Article › 同行評審

2 引文斯高帕斯（Scopus）

摘要

Contaminated electrode effects of a retarding potential trap on the temperature measurement are investigated in laboratory plasma. It is shown that poorly conductive layers on the electrode surface modify the v-i curves. This contamination effect of RPT electrode can be overcome either by increasing the sweep-rate of the grid potential or by the use of a large effective sheath resistance.

原文	English
頁（從 - 到）	1309-1312
頁數	4
期刊	Planetary and Space Science
卷	23
發行號	9
DOIs	https://doi.org/10.1016/0032-0633(75)90154-3
出版狀態	Published - 1975 1月 1

All Science Journal Classification (ASJC) codes

天文和天體物理學
空間與行星科學

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10.1016/0032-0633(75)90154-3

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引用此

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Erroneous evaluation of electron and ion temperatures from a contaminated retarding potential trap

摘要

All Science Journal Classification (ASJC) codes

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